Principles of semiconductor network testing / Amir Afshar.
By: Afshar, Amir
Copyright date: C 1995Publisher: Newton, MA : Butterworth-Heinemann. Description: xiv, 213 pagesContent type: text Media type: unmediated Carrier type: volumeISBN: 0-7506-9472-6Subject(s): Integrated circuits -- testing | Semiconductors -- Testings| Item type | Current location | Home library | Call number | Copy number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
| Circulation | Sibalom | Sibalom Circulation | 621.3815 Ad8p 1995 (Browse shelf) | 1 | Available | UAMAIN 22264 |
Total holds: 0
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| 621.38132 M432 2010 Introduction to digital microelectronic circuits / | 621.38133 S47125 2015 Semiconductor terahertz technology: devices and systems at room temperature operation / | 621.3815 1998 Fundamentals of linear electronics : integrated and discrete / | 621.3815 Ad8p 1995 Principles of semiconductor network testing / | 621.3815 B4711 2015 Modern diesel technology : diesel engines / | 621.3815 B54e 2003 Electronics : circuits and systems / | 621.3815 B7927 2013 Electronic devices and circuit theory / |
Includes bibliographical references and index.
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