Principles of semiconductor network testing / Amir Afshar.

By: Afshar, Amir
Copyright date: C 1995Publisher: Newton, MA : Butterworth-Heinemann. Description: xiv, 213 pagesContent type: text Media type: unmediated Carrier type: volumeISBN: 0-7506-9472-6Subject(s): Integrated circuits -- testing | Semiconductors -- Testings
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Item type Current location Home library Call number Copy number Status Date due Barcode Item holds
Circulation Sibalom
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Circulation 		621.3815 Ad8p 1995 (Browse shelf) 1 Available UAMAIN 22264
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Includes bibliographical references and index.

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